Conf 2008
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Thematic Session
- Industrial
Coordinators: Jose Luis Viviente & Emilio Prieto
E-mail:
joseluis.viviente@inasmet.es
&
eprieto@cem.mityc.es
SCIENTIFIC PROGRAM
Tuesday - April 15, 2008
15h00-15h20
Emilio Prieto
(CEM, Spain)
"Standardization in Nanotechnologies. The AENOR Spanish Group GET15 and its role within ISO and CEN"
15h20-15h40
Jun Xiao
(CETR, USA)
"
Scanning Nano-Metrology of ultra thin films"
15h40-16h20
Martin Hernandez-Palacios
(Aliter, Spain)
"Nanotechnology Master Overview"
16h20-16h50
Javier Grávalos
(Acciona, Spain)
“Nanotechnology in Acciona: Prometeo project, the development of advanced materials for construction components.”
16h50-17h10
Speaker to be defined
17h10-17h30
Discussion & Conclusion
Registered Participants (12)
Last Name
Name
Institution
Country
Alarcon Clemente
Ana
FEI Europe B.V.
Spain
Amantia
David
LEITAT Tecnological Center
Spain
Ansón
Alejandro
Instituto de Carboquímica-CSIC
Spain
Campillo
Igor
CIC nanoGUNE
Spain
Carcedo
Laura
Centro Español de Metrología
Spain
Fernández
Maite
Phantoms Foundation
Spain
Gil
Adriana
Nanotec Electronica S.L.
Spain
Grávalos
Javier
Acciona
Spain
Hernandez-Palacios
Martin
Aliter
Spain
Prieto
Emilio
Centro Español de Metrología
Spain
Torcal-Milla
Francisco J.
Universidad Complutense de Madrid
Spain
Xiao
Jun
CETR
USA
